Fault Ride-Through of Grid-Forming Converters in Weak Power Grids: Validation in Voltage- and Reactive-Power Control Modes
Yousef Khayat; Peiyuan Chen; Massimo Bongiorno; Saeed Golestan; Rasool Heydari
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Industry Applications
- Research area
- Energy & infrastructure
- Source type
- Journal article
- DOI
- 10.1109/tia.2026.3739270
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Cite this source
Yousef Khayat; Peiyuan Chen; Massimo Bongiorno; Saeed Golestan; Rasool Heydari. Fault Ride-Through of Grid-Forming Converters in Weak Power Grids: Validation in Voltage- and Reactive-Power Control Modes. IEEE Transactions on Industry Applications. 2026. https://doi.org/10.1109/tia.2026.3739270