Power Spectral Density of Thermal Noise at High Frequencies in Thermal Conductance for Semiconductor Devices
Kejun Xia
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Journal of the Electron Devices Society
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jeds.2026.3665477
The original publisher provides the full text and its access options.
Cite this source
Kejun Xia. Power Spectral Density of Thermal Noise at High Frequencies in Thermal Conductance for Semiconductor Devices. IEEE Journal of the Electron Devices Society. 2026. https://doi.org/10.1109/jeds.2026.3665477