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Research literature / Conference paper

Unveiling the Mask: Trusted Semiconductor Manufacturing through Wafer-Level Mask-Set Attestation

Suraag Sunil Tellakula; Ching-Yi Chang; Matthew Nigh; Christos Vasileiou; John Carulli; Yiorgos Makris

Published
Publisher
IEEE
Journal / collection
2025 IEEE/ACM International Conference On Computer Aided Design (ICCAD)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/iccad66269.2025.11241009

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Suraag Sunil Tellakula; Ching-Yi Chang; Matthew Nigh; Christos Vasileiou; John Carulli; Yiorgos Makris. Unveiling the Mask: Trusted Semiconductor Manufacturing through Wafer-Level Mask-Set Attestation. 2025 IEEE/ACM International Conference On Computer Aided Design (ICCAD). 2025-10-26. https://doi.org/10.1109/iccad66269.2025.11241009

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