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Research literature / Preprint / posted paper

YieldLineage: Reliability-Gated Wafer Genealogy Reasoning for Early Yield-Excursion Warning in Semiconductor Manufacturing

Qinao Hu

Published
Publisher
Elsevier BV
Research area
Semiconductors
Source type
Preprint / posted paper
DOI
10.2139/ssrn.7412447

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Qinao Hu. YieldLineage: Reliability-Gated Wafer Genealogy Reasoning for Early Yield-Excursion Warning in Semiconductor Manufacturing. Elsevier BV. 2026. https://doi.org/10.2139/ssrn.7412447

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