A Dual Power Grid Cascading Failure Model for the Vulnerability Analysis
Tianxin Zhou; Xiang Li; Haibing Lu
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Smart Grid
- Research area
- Energy & infrastructure
- Source type
- Journal article
- DOI
- 10.1109/tsg.2025.3612371
The original publisher provides the full text and its access options.
Cite this source
Tianxin Zhou; Xiang Li; Haibing Lu. A Dual Power Grid Cascading Failure Model for the Vulnerability Analysis. IEEE Transactions on Smart Grid. 2026-01. https://doi.org/10.1109/tsg.2025.3612371