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Effect of Surface Passivation of CZTS Semiconductor Detector on Leakage Current

DOE; Anthony Kangethe; EM; Savannah River National Laboratory (SRNL), Aiken, SC (United States); Utpal Roy; Kirsten Johnson; Sonja Boettcher; Steven Demers; Martine Duff; Stephen Egarievwe

Published
Publisher
Office of Scientific and Technical Information (OSTI)
Research area
Semiconductors
Source type
Report
DOI
10.2172/2575102

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DOE; Anthony Kangethe; EM; Savannah River National Laboratory (SRNL), Aiken, SC (United States); Utpal Roy; Kirsten Johnson; Sonja Boettcher; Steven Demers; Martine Duff; Stephen Egarievwe. Effect of Surface Passivation of CZTS Semiconductor Detector on Leakage Current. Office of Scientific and Technical Information (OSTI). 2025-08-07. https://doi.org/10.2172/2575102

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