Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Journal article

Methodologies for Electrical Measurement and Parameter Analysis of 2D Semiconductor Transistors

Kyungwu Kwon; Hyemyeong Lee; Seunguk Song

Published
Publisher
Ceramist
Journal / collection
Ceramist
Research area
Semiconductors
Source type
Journal article
DOI
10.31613/ceramist.2025.00101

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Kyungwu Kwon; Hyemyeong Lee; Seunguk Song. Methodologies for Electrical Measurement and Parameter Analysis of 2D Semiconductor Transistors. Ceramist. 2025-06-30. https://doi.org/10.31613/ceramist.2025.00101

Download RIS