Semiconductor-Based Fault Current Interruption Technology in DC Distribution Systems
Dong Jin Yun; Seong Eon Kim; Cheol Jun Shin; Hee Su Kang; Jae Seop Ryu; Chae Yoon Bae
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE Seventh International Conference on DC Microgrids (ICDCM)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/icdcm63994.2025.11144666
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Cite this source
Dong Jin Yun; Seong Eon Kim; Cheol Jun Shin; Hee Su Kang; Jae Seop Ryu; Chae Yoon Bae. Semiconductor-Based Fault Current Interruption Technology in DC Distribution Systems. 2025 IEEE Seventh International Conference on DC Microgrids (ICDCM). 2025-06-04. https://doi.org/10.1109/icdcm63994.2025.11144666