Supply Chain Anomaly Detection by using Simulation and Machine Learning
Tatsuya Inaba
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/ieem63636.2025.11357657
The original publisher provides the full text and its access options.
Cite this source
Tatsuya Inaba. Supply Chain Anomaly Detection by using Simulation and Machine Learning. 2025 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM). 2025-12-07. https://doi.org/10.1109/ieem63636.2025.11357657