Enhancing Transistor Circuit Education Through Real-Time Demonstrations with Analogue Meters
Bee-Yen Toh; Neil Buchanan
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE Global Engineering Education Conference (EDUCON)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/educon67543.2026.11574395
The original publisher provides the full text and its access options.
Cite this source
Bee-Yen Toh; Neil Buchanan. Enhancing Transistor Circuit Education Through Real-Time Demonstrations with Analogue Meters. 2026 IEEE Global Engineering Education Conference (EDUCON). 2026-04-27. https://doi.org/10.1109/educon67543.2026.11574395