Identification of Counterfeit Integrated Circuits Using a Low-Cost Near-Field Microprobe Scanning Setup
Michael Kögel; Sebastian Brand; Sebastian Tismer; Frank Altmann; Adrian Juwien
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Journal of Failure Analysis and Prevention
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s11668-026-02595-3
The original publisher provides the full text and its access options.
Cite this source
Michael Kögel; Sebastian Brand; Sebastian Tismer; Frank Altmann; Adrian Juwien. Identification of Counterfeit Integrated Circuits Using a Low-Cost Near-Field Microprobe Scanning Setup. Journal of Failure Analysis and Prevention. 2026-09-28. https://doi.org/10.1007/s11668-026-02595-3