An Overview of the Application of Modern Statistical Techniques in Semiconductor Manufacturing
Hsuan-Yu Chen; Chiachung Chen
- Published
- Publisher
- MDPI AG
- Journal / collection
- Applied System Innovation
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/asi9040083
The original publisher provides the full text and its access options.
Cite this source
Hsuan-Yu Chen; Chiachung Chen. An Overview of the Application of Modern Statistical Techniques in Semiconductor Manufacturing. Applied System Innovation. 2026-04-21. https://doi.org/10.3390/asi9040083