Toward data-driven reliability in hydrogel semiconductor devices: forecasting approaches for degradation and signal stability
Anbazhagan Geetha; S. Preethi; J. Santhakumar
- Published
- Publisher
- Frontiers Media SA
- Journal / collection
- Frontiers in Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3389/fmats.2026.1945407
The original publisher provides the full text and its access options.
Cite this source
Anbazhagan Geetha; S. Preethi; J. Santhakumar. Toward data-driven reliability in hydrogel semiconductor devices: forecasting approaches for degradation and signal stability. Frontiers in Materials. 2026-09-30. https://doi.org/10.3389/fmats.2026.1945407