Layout-Aware Analysis of Transistor Fingering Effects on Hysteresis and Reliability in CMOS Schmitt Triggers
Liron Cohen; Emmanuel Bender
- Published
- Publisher
- MDPI AG
- Journal / collection
- Chips
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/chips4040045
The original publisher provides the full text and its access options.
Cite this source
Liron Cohen; Emmanuel Bender. Layout-Aware Analysis of Transistor Fingering Effects on Hysteresis and Reliability in CMOS Schmitt Triggers. Chips. 2025-11-01. https://doi.org/10.3390/chips4040045