Author Correction: Industrial reliability testing of transistor gate dielectrics
Ernest Y. Wu; Tibor Grasser; Mario Lanza
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Nature Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1038/s41928-026-01690-5
The original publisher provides the full text and its access options.
Cite this source
Ernest Y. Wu; Tibor Grasser; Mario Lanza. Author Correction: Industrial reliability testing of transistor gate dielectrics. Nature Electronics. 2026-07-30. https://doi.org/10.1038/s41928-026-01690-5