Analysis and Structural Mitigation of Trapping-State-Trap Induced Drain Leakage Current in Buried-Channel-Array Transistor
Jeonghyeon Yun; Suyeon Kim; Dongyeong Kim; Jewon Park; Sinwook Kim; Ryun Kang; Chaehyuk Lim; Sowon Kim; Hyeona Seo; Hyerin Lee; Juwon Lee; Geon Kim; Myoungjin Lee
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Device and Materials Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tdmr.2026.3684027
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Jeonghyeon Yun; Suyeon Kim; Dongyeong Kim; Jewon Park; Sinwook Kim; Ryun Kang; Chaehyuk Lim; Sowon Kim; Hyeona Seo; Hyerin Lee; Juwon Lee; Geon Kim; Myoungjin Lee. Analysis and Structural Mitigation of Trapping-State-Trap Induced Drain Leakage Current in Buried-Channel-Array Transistor. IEEE Transactions on Device and Materials Reliability. 2026-06. https://doi.org/10.1109/tdmr.2026.3684027