Novel Hybrid Semiconductor-Cellular Standard for 3D FIB-SEM Nanotomography Analysis
Alyssa Williams; Alexandre Laquerre; Kathryn Grandfield; Nabil Bassim; Michael W Phaneuf
- Published
- Publisher
- Oxford University Press (OUP)
- Journal / collection
- Microscopy and Microanalysis
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1093/mam/ozag036
The original publisher provides the full text and its access options.
Cite this source
Alyssa Williams; Alexandre Laquerre; Kathryn Grandfield; Nabil Bassim; Michael W Phaneuf. Novel Hybrid Semiconductor-Cellular Standard for 3D FIB-SEM Nanotomography Analysis. Microscopy and Microanalysis. 2026-07-01. https://doi.org/10.1093/mam/ozag036