Skip to content
Independent research & intelligence
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Journal article

Failure Prediction in Manufacturing Processes Via Kullback–Leibler Divergence

Gianluca Tabella; Mohammed Ayalew Belay; Ismael Viejo; María Herrando; Pierluigi Salvo Rossi

Published
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Journal / collection
IEEE Sensors Letters
Research area
Industrial systems
Source type
Journal article
DOI
10.1109/lsens.2025.3641051

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Gianluca Tabella; Mohammed Ayalew Belay; Ismael Viejo; María Herrando; Pierluigi Salvo Rossi. Failure Prediction in Manufacturing Processes Via Kullback–Leibler Divergence. IEEE Sensors Letters. 2026-01. https://doi.org/10.1109/lsens.2025.3641051

Download RIS