Comprehensive Fault Isolation Technologies for the Gate-All-Around Transistor and Backside Power Delivery Paradigm Shifts
Mitchell J. Senger; Mauricio Posada; Christopher Morgan; Megan Knapp; Grace M. E. Khoo; Bathiya P. Senevirathna; Praneeth Ranga; Ryan Fredrickson; MIR Tanjidur Rahman; Travis Williams; Samantha Lubaba Noor; Manoj Devendhiran; Prasoon Joshi; Ashkan Abtahi; Kimberlee Celio; Joseph Basile; Eric Norum; Matthew H. Kirsch; Miriam Cezza; Samia Rahman
- Published
- Publisher
- ASM International
- Journal / collection
- International Symposium for Testing and Failure Analysis
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.31399/asm.cp.istfa2025p0208
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Cite this source
Mitchell J. Senger; Mauricio Posada; Christopher Morgan; Megan Knapp; Grace M. E. Khoo; Bathiya P. Senevirathna; Praneeth Ranga; Ryan Fredrickson; MIR Tanjidur Rahman; Travis Williams; Samantha Lubaba Noor; Manoj Devendhiran; Prasoon Joshi; Ashkan Abtahi; Kimberlee Celio; Joseph Basile; Eric Norum; Matthew H. Kirsch; Miriam Cezza; Samia Rahman. Comprehensive Fault Isolation Technologies for the Gate-All-Around Transistor and Backside Power Delivery Paradigm Shifts. International Symposium for Testing and Failure Analysis. 2025-11-16. https://doi.org/10.31399/asm.cp.istfa2025p0208