3-D Monolithic-Integrated BEOL-Compatible Oxide Semiconductor FETs on GaN HEMTs: CEO-GaN
Gerui Zheng; Hanjie Li; Liyan Huang; Jiawei Xie; Zijie Zheng; Hanlin Xie; Yuxuan Wang; Xuanqi Chen; Wenhua Gu; Geok Ing Ng; Xiao Gong
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2026.3677393
The original publisher provides the full text and its access options.
Cite this source
Gerui Zheng; Hanjie Li; Liyan Huang; Jiawei Xie; Zijie Zheng; Hanlin Xie; Yuxuan Wang; Xuanqi Chen; Wenhua Gu; Geok Ing Ng; Xiao Gong. 3-D Monolithic-Integrated BEOL-Compatible Oxide Semiconductor FETs on GaN HEMTs: CEO-GaN. IEEE Transactions on Electron Devices. 2026-06. https://doi.org/10.1109/ted.2026.3677393