Range-Aware Deep Learning Framework for Multi-Parameter Electrical Test Prediction in Semiconductor Manufacturing
Jihyun Kim; Sunhyeok Hwang; Jinyong Jeong; Jaehoon Jeong; Kyu-Baik Chang; Hanlim Choi; Suyeon Shon; Seoung Bum Kim
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE 21st International Conference on Automation Science and Engineering (CASE)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/case58245.2025.11164069
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Cite this source
Jihyun Kim; Sunhyeok Hwang; Jinyong Jeong; Jaehoon Jeong; Kyu-Baik Chang; Hanlim Choi; Suyeon Shon; Seoung Bum Kim. Range-Aware Deep Learning Framework for Multi-Parameter Electrical Test Prediction in Semiconductor Manufacturing. 2025 IEEE 21st International Conference on Automation Science and Engineering (CASE). 2025-08-17. https://doi.org/10.1109/case58245.2025.11164069