Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing
Adrian Poniatowski; Natalie Gentner; Manuel Barusco; Davide Dalle Pezze; Samuele Salti; Gian Antonio Susto
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Automation Science and Engineering
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tase.2025.3621854
The original publisher provides the full text and its access options.
Cite this source
Adrian Poniatowski; Natalie Gentner; Manuel Barusco; Davide Dalle Pezze; Samuele Salti; Gian Antonio Susto. Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing. IEEE Transactions on Automation Science and Engineering. 2026. https://doi.org/10.1109/tase.2025.3621854