Work Function Tuning in Strain Induced Double Gated Junctionless Transistor: A Device to Circuit Performance Study for Sub-20nm Nodes
Tika Ram Pokhrel; Alaaddin Al-Shidaifat; Hanjung Song; Alak Majumder
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Circuits, Systems, and Signal Processing
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s00034-025-03133-6
The original publisher provides the full text and its access options.
Cite this source
Tika Ram Pokhrel; Alaaddin Al-Shidaifat; Hanjung Song; Alak Majumder. Work Function Tuning in Strain Induced Double Gated Junctionless Transistor: A Device to Circuit Performance Study for Sub-20nm Nodes. Circuits, Systems, and Signal Processing. 2025-05-03. https://doi.org/10.1007/s00034-025-03133-6