All-optically measuring opaque thin-film thickness with 2D layered semiconductor as ultrafast photoacoustic transducer
Feiyang Hou; Zhen Yue; He Zhang; Yujie Wang; Siqin Bin; Ziqiang Guan; Guangquan Zhou; Chunxiang Xu; Qiannan Cui
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Optics & Laser Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.optlastec.2026.115271
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Cite this source
Feiyang Hou; Zhen Yue; He Zhang; Yujie Wang; Siqin Bin; Ziqiang Guan; Guangquan Zhou; Chunxiang Xu; Qiannan Cui. All-optically measuring opaque thin-film thickness with 2D layered semiconductor as ultrafast photoacoustic transducer. Optics & Laser Technology. 2026-09. https://doi.org/10.1016/j.optlastec.2026.115271