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Research literature / Conference paper

NEGF-Based Evaluation of Transistor Efficiency and Quality Factor in Sub-5 nm Junctionless CNTFETs

Md Akram Ahmad; Muzaffar Imam; Syed Sadique Anwer Askari; Bhubon Chandra Mech; Chandan Nayak; Jitendra Kumar

Published
Publisher
IEEE
Journal / collection
2025 IEEE International Conference on Electrical, Electronics, Communication and Computers (ELEXCOM)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/elexcom67950.2025.11451314

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Md Akram Ahmad; Muzaffar Imam; Syed Sadique Anwer Askari; Bhubon Chandra Mech; Chandan Nayak; Jitendra Kumar. NEGF-Based Evaluation of Transistor Efficiency and Quality Factor in Sub-5 nm Junctionless CNTFETs. 2025 IEEE International Conference on Electrical, Electronics, Communication and Computers (ELEXCOM). 2025-12-20. https://doi.org/10.1109/elexcom67950.2025.11451314

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