In-Depth Analysis of Floating Body Effects in 3D DRAM Access Transistor: Scaling and Material Perspectives
Ki-Nam Park; Hyun-Jun Kang; Seon-Jin Yoo; Hyeong-Jin Lee; Joon-Kyu Han
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Device and Materials Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tdmr.2026.3731812
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Cite this source
Ki-Nam Park; Hyun-Jun Kang; Seon-Jin Yoo; Hyeong-Jin Lee; Joon-Kyu Han. In-Depth Analysis of Floating Body Effects in 3D DRAM Access Transistor: Scaling and Material Perspectives. IEEE Transactions on Device and Materials Reliability. 2026. https://doi.org/10.1109/tdmr.2026.3731812