Current Status and Challenges of Defense Semiconductor Test and Evaluation Standards: Focusing on the Linkage of Defense Testing and Qualification to Measurement Quality
Society for Standards, Certification and Safety; Hwang Mikyung; Jin Seongman; Kim Jongwon
- Published
- Publisher
- Society for Standards Certification and Safety
- Journal / collection
- Society for Standards Certification and Safety
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.34139/jscs.2026.16.3.31
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Cite this source
Society for Standards, Certification and Safety; Hwang Mikyung; Jin Seongman; Kim Jongwon. Current Status and Challenges of Defense Semiconductor Test and Evaluation Standards: Focusing on the Linkage of Defense Testing and Qualification to Measurement Quality. Society for Standards Certification and Safety. 2026-09-30. https://doi.org/10.34139/jscs.2026.16.3.31