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Evaluation of point defects as Charge Noise Sources in Semiconductor Quantum Dot Qubits

Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States); Shivani Srivastava; USDOE National Nuclear Security Administration (NNSA); Vincenzo Lordi; Joel Varley

Published
Publisher
Office of Scientific and Technical Information (OSTI)
Research area
Semiconductors
Source type
Report
DOI
10.2172/3389375

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Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States); Shivani Srivastava; USDOE National Nuclear Security Administration (NNSA); Vincenzo Lordi; Joel Varley. Evaluation of point defects as Charge Noise Sources in Semiconductor Quantum Dot Qubits. Office of Scientific and Technical Information (OSTI). 2026-07-28. https://doi.org/10.2172/3389375

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