Investigation on Degenerate Subbands Induced by Stress and Quantum Confinement in n-Type Silicon Junctionless Nanowire Transistor at Low Temperatures
Jingdi Hou; Liuhong Ma; Weihua Han
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Silicon
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s12633-025-03368-7
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Cite this source
Jingdi Hou; Liuhong Ma; Weihua Han. Investigation on Degenerate Subbands Induced by Stress and Quantum Confinement in n-Type Silicon Junctionless Nanowire Transistor at Low Temperatures. Silicon. 2025-06-17. https://doi.org/10.1007/s12633-025-03368-7