Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Gate All Around Tunnel Field Effect Transistor for Future VLSI Applications

Sanjeet Kumar Sinha; Sweta Chander

Published
Publisher
IEEE
Journal / collection
2025 11th International Conference on Smart Computing and Communications (ICSCC)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/icscc66177.2025.11233422

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Sanjeet Kumar Sinha; Sweta Chander. Gate All Around Tunnel Field Effect Transistor for Future VLSI Applications. 2025 11th International Conference on Smart Computing and Communications (ICSCC). 2025-07-03. https://doi.org/10.1109/icscc66177.2025.11233422

Download RIS