Performance-Oriented Analytical Modelling of Channel Engineered-Macaroni Induced Gate All Around Field Effect Transistor for Off-State Leakage Mitigation
Aapurva Kaul; Sonam Rewari; Deva Nand
- Published
- Publisher
- The Electrochemical Society
- Journal / collection
- ECS Journal of Solid State Science and Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1149/2162-8777/ae09d8
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Cite this source
Aapurva Kaul; Sonam Rewari; Deva Nand. Performance-Oriented Analytical Modelling of Channel Engineered-Macaroni Induced Gate All Around Field Effect Transistor for Off-State Leakage Mitigation. ECS Journal of Solid State Science and Technology. 2025-10-01. https://doi.org/10.1149/2162-8777/ae09d8