Transistor Reliability in 18A RibbonFET Technology
Steven Novak; Anupama Bowonder; David Towner; Dyan Ali; Ferando Lugo; Harshad Surdi; Jeff Hicks; Kihyun Choi; Kaustubh Joshi; Mikael Broas; Pradyumna Muralidharan; Rahul Pandey Rahul Ramamurthy; Subhadeep Mukhopadhyay; Yasin Kaya; Inanc Meric
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE International Reliability Physics Symposium (IRPS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/irps61424.2026.11499201
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Cite this source
Steven Novak; Anupama Bowonder; David Towner; Dyan Ali; Ferando Lugo; Harshad Surdi; Jeff Hicks; Kihyun Choi; Kaustubh Joshi; Mikael Broas; Pradyumna Muralidharan; Rahul Pandey Rahul Ramamurthy; Subhadeep Mukhopadhyay; Yasin Kaya; Inanc Meric. Transistor Reliability in 18A RibbonFET Technology. 2026 IEEE International Reliability Physics Symposium (IRPS). 2026-03-22. https://doi.org/10.1109/irps61424.2026.11499201