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Research literature / Conference paper

Calorimetric-Based Condition Monitoring and Reliability Assessment of Power Semiconductor Devices in Electric Vehicle Inverters

Shahriar Sarmast Ghahfarokhi; Enes Ayaz; Stanisław Oliszewski; Staffan Norrga; Hans-Peter Nee

Published
Publisher
IEEE
Journal / collection
2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia)
Research area
Semiconductors
Source type
Conference paper
DOI
10.23919/ipec-nagasaki2026-ec64663.2026.11596613

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Shahriar Sarmast Ghahfarokhi; Enes Ayaz; Stanisław Oliszewski; Staffan Norrga; Hans-Peter Nee. Calorimetric-Based Condition Monitoring and Reliability Assessment of Power Semiconductor Devices in Electric Vehicle Inverters. 2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia). 2026-05-31. https://doi.org/10.23919/ipec-nagasaki2026-ec64663.2026.11596613

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