Eddy current method for studying the electrical conductivity of semiconductor and thin-film materials
Darya Medvedeva; Elena Soldatova; Sergey Voinash; Alisher Shirinov; Mukhiba Sulaymanova; Dildora Badiyeva; Irina Vornacheva
- Published
- Publisher
- SPIE
- Journal / collection
- Optical and Computational Technologies for Measurements and Industrial Applications (OptiComp 2025)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1117/12.3074623
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Cite this source
Darya Medvedeva; Elena Soldatova; Sergey Voinash; Alisher Shirinov; Mukhiba Sulaymanova; Dildora Badiyeva; Irina Vornacheva. Eddy current method for studying the electrical conductivity of semiconductor and thin-film materials. Optical and Computational Technologies for Measurements and Industrial Applications (OptiComp 2025). 2025-09-23. https://doi.org/10.1117/12.3074623