High-precision Defect Detection of Glass for Thin-film Transistor Liquid Crystal Display Using YOLO Algorithms
Rihui Tan; Chih-Cheng Chen; Kai-An Kuo; Ben-Yi Liau; Ching-Kun Chen; Shu-Han Liao; Shi-Kai Guo; Kai-Yi Tang; Wei-Hong Lee; Suting Li
- Published
- Publisher
- MYU K.K.
- Journal / collection
- Sensors and Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.18494/sam5574
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Cite this source
Rihui Tan; Chih-Cheng Chen; Kai-An Kuo; Ben-Yi Liau; Ching-Kun Chen; Shu-Han Liao; Shi-Kai Guo; Kai-Yi Tang; Wei-Hong Lee; Suting Li. High-precision Defect Detection of Glass for Thin-film Transistor Liquid Crystal Display Using YOLO Algorithms. Sensors and Materials. 2025-06-20. https://doi.org/10.18494/sam5574