Deep Learning for Semiconductor Chip Quality Assessment
Yang LIU; Xiaozhan LI; Xuejun ZHANG; Junqi YUAN; Bozhen ZHANG; Meiqin LIANG
- Published
- Publisher
- Institute of Electronics, Information and Communications Engineers (IEICE)
- Journal / collection
- IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1587/transfun.2025eap1108
The original publisher provides the full text and its access options.
Cite this source
Yang LIU; Xiaozhan LI; Xuejun ZHANG; Junqi YUAN; Bozhen ZHANG; Meiqin LIANG. Deep Learning for Semiconductor Chip Quality Assessment. IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. 2026-06-01. https://doi.org/10.1587/transfun.2025eap1108