Navigating Scaling Methods Using High-K/2D Integration in a Transistor
Hyojin Yang; Sungho Park; Dae Hwan Kim; Sung-Jin Choi; Yoon Jung Lee
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Transactions on Electrical and Electronic Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s42341-025-00664-2
The original publisher provides the full text and its access options.
Cite this source
Hyojin Yang; Sungho Park; Dae Hwan Kim; Sung-Jin Choi; Yoon Jung Lee. Navigating Scaling Methods Using High-K/2D Integration in a Transistor. Transactions on Electrical and Electronic Materials. 2025-08-05. https://doi.org/10.1007/s42341-025-00664-2