A Switchable Longitudinal & Shear BLS Microscope for Comprehensive Modulus Imaging of Semiconductor Packaging Materials
Andrew J. Gayle; Sebastian Engmann; Ran Tao; Andrew G. Korovich; Polette Centellas; Yvonne B. Gerbig; Christopher L. Soles; Chris A. Michaels
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE 76th Electronic Components and Technology Conference (ECTC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ectc51846.2026.00313
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Cite this source
Andrew J. Gayle; Sebastian Engmann; Ran Tao; Andrew G. Korovich; Polette Centellas; Yvonne B. Gerbig; Christopher L. Soles; Chris A. Michaels. A Switchable Longitudinal & Shear BLS Microscope for Comprehensive Modulus Imaging of Semiconductor Packaging Materials. 2026 IEEE 76th Electronic Components and Technology Conference (ECTC). 2026-05-26. https://doi.org/10.1109/ectc51846.2026.00313