Extreme Temperature Operation of (U)WBG Semiconductor Devices
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); James Lundh; USDOE National Nuclear Security Administration (NNSA); Brianna Klein; Andrew Cantrell; Tolen Nelson; Geoffrey Foster; GlenAsia Gonzalez; Alan Jacobs; Andrew Koehler; Marko Tadjer; Andrew Allerman; Andrew Armstrong; Troy Olsson; Karl Hobart; Michael Mastro
- Published
- Publisher
- Office of Scientific and Technical Information (OSTI)
- Research area
- Semiconductors
- Source type
- Report
- DOI
- 10.2172/3414017
The original publisher provides the full text and its access options.
Cite this source
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); James Lundh; USDOE National Nuclear Security Administration (NNSA); Brianna Klein; Andrew Cantrell; Tolen Nelson; Geoffrey Foster; GlenAsia Gonzalez; Alan Jacobs; Andrew Koehler; Marko Tadjer; Andrew Allerman; Andrew Armstrong; Troy Olsson; Karl Hobart; Michael Mastro. Extreme Temperature Operation of (U)WBG Semiconductor Devices. Office of Scientific and Technical Information (OSTI). 2025-08-01. https://doi.org/10.2172/3414017