Skip to content
Independent research & intelligence
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Journal article

Metal vacancy engineering breaks hole mobility barriers in semiconductor oxide photoelectrodes

Li Xu; Suyuan Cheng; Bing He; Liming Liu; Ziyi Qiao; Lingyi Li; Yingkui Yang; Xueqin Liu

Published
Publisher
Elsevier BV
Journal / collection
Journal of Energy Chemistry
Research area
Semiconductors
Source type
Journal article
DOI
10.1016/j.jechem.2026.05.014

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Li Xu; Suyuan Cheng; Bing He; Liming Liu; Ziyi Qiao; Lingyi Li; Yingkui Yang; Xueqin Liu. Metal vacancy engineering breaks hole mobility barriers in semiconductor oxide photoelectrodes. Journal of Energy Chemistry. 2026-08. https://doi.org/10.1016/j.jechem.2026.05.014

Download RIS