Deep learning-based defect detection for critical power grid components
Chengwei Huang; Yifan Lu; Songtao Lan; Qinqiu Qing; Zhaoyang Lai; Likun Huang; Bingyan Wei
- Published
- Publisher
- Institution of Engineering and Technology (IET)
- Journal / collection
- IET Conference Proceedings
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1049/icp.2025.2995
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Cite this source
Chengwei Huang; Yifan Lu; Songtao Lan; Qinqiu Qing; Zhaoyang Lai; Likun Huang; Bingyan Wei. Deep learning-based defect detection for critical power grid components. IET Conference Proceedings. 2025-10. https://doi.org/10.1049/icp.2025.2995