Bayesian Inversion for the Identification of the Doping Profile in Unipolar Semiconductor Devices
Leila Taghizadeh; Ansgar Jüngel
- Published
- Publisher
- Society for Industrial & Applied Mathematics (SIAM)
- Journal / collection
- SIAM Journal on Scientific Computing
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1137/24m1687042
The original publisher provides the full text and its access options.
Cite this source
Leila Taghizadeh; Ansgar Jüngel. Bayesian Inversion for the Identification of the Doping Profile in Unipolar Semiconductor Devices. SIAM Journal on Scientific Computing. 2025-05-30. https://doi.org/10.1137/24m1687042