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Research literature / Conference paper

Modeling and Simulation of Defect-Induced Reliability Challenges in Modern Semiconductor Materials

Jayanth Kolli; Kshitij Jain; Sudhanshu Maurya; Snehlata Wankhade; Azizbek Matmuratov; Loknath Kumar

Published
Publisher
IEEE
Journal / collection
2025 International Conference on Intelligent and Secure Engineering Solutions (CISES)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/cises66934.2025.11265634

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Jayanth Kolli; Kshitij Jain; Sudhanshu Maurya; Snehlata Wankhade; Azizbek Matmuratov; Loknath Kumar. Modeling and Simulation of Defect-Induced Reliability Challenges in Modern Semiconductor Materials. 2025 International Conference on Intelligent and Secure Engineering Solutions (CISES). 2025-08-11. https://doi.org/10.1109/cises66934.2025.11265634

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