A Defect Dataset for Electrode Coating Manufacturing
Vignesh Sampath; Andrew S. Lee; Samuel David Miller; Noah H. Paulson; Yuepeng Zhang; Logan Ward
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Scientific Data
- Research area
- Industrial systems
- Source type
- Journal article
- DOI
- 10.1038/s41597-025-06419-1
The original publisher provides the full text and its access options.
Cite this source
Vignesh Sampath; Andrew S. Lee; Samuel David Miller; Noah H. Paulson; Yuepeng Zhang; Logan Ward. A Defect Dataset for Electrode Coating Manufacturing. Scientific Data. 2026-02-14. https://doi.org/10.1038/s41597-025-06419-1