P‐1.3: Effect of Annealing Temperature on Electrical Performance of IGZTO Thin‐Film Transistor
Weicheng Cao; Zhiyi Li; Gaobin Liu; Fang Wu; Dan Liu; Shufang Zhang; Liang Fang
- Published
- Publisher
- Wiley
- Journal / collection
- SID Symposium Digest of Technical Papers
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/sdtp.70003_260
The original publisher provides the full text and its access options.
Cite this source
Weicheng Cao; Zhiyi Li; Gaobin Liu; Fang Wu; Dan Liu; Shufang Zhang; Liang Fang. P‐1.3: Effect of Annealing Temperature on Electrical Performance of IGZTO Thin‐Film Transistor. SID Symposium Digest of Technical Papers. 2026-08. https://doi.org/10.1002/sdtp.70003_260