Power Cycling Testing for Power Semiconductor Switches: Methods, Standards, Limitations, and Outlooks
Yi Zhang; Patrick Heimler; James Opondo Abuogo; Xinyue Zhang; Yichi Zhang; Dong Xie; Yuhao Zhang; Kaichen Zhang; Xiang Li; Haoze Luo; Ralf Schmidt; Frede Blaabjerg; Huai Wang; Thomas Basler
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Power Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tpel.2025.3595180
The original publisher provides the full text and its access options.
Cite this source
Yi Zhang; Patrick Heimler; James Opondo Abuogo; Xinyue Zhang; Yichi Zhang; Dong Xie; Yuhao Zhang; Kaichen Zhang; Xiang Li; Haoze Luo; Ralf Schmidt; Frede Blaabjerg; Huai Wang; Thomas Basler. Power Cycling Testing for Power Semiconductor Switches: Methods, Standards, Limitations, and Outlooks. IEEE Transactions on Power Electronics. 2026-01. https://doi.org/10.1109/tpel.2025.3595180