Noise-Robust On-the-Fly Measurement of the On-State Resistance of Power Semiconductor Devices
Junho Shin; Jong-Won Shin
- Published
- Publisher
- The Korean Institute of Power Electronics
- Journal / collection
- THE TRANSACTIONS OF KOREAN INSTITUTE OF POWER ELECTRONICS
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.6113/tkpe.2025.30.2.159
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Cite this source
Junho Shin; Jong-Won Shin. Noise-Robust On-the-Fly Measurement of the On-State Resistance of Power Semiconductor Devices. THE TRANSACTIONS OF KOREAN INSTITUTE OF POWER ELECTRONICS. 2025-04-30. https://doi.org/10.6113/tkpe.2025.30.2.159