Out-of-Distribution Detection for Semiconductor Wafer Map Defect Using GAN and Outlier-Exposure
Minju Kim; Jaehyeop Hong; Youngbum Hur
- Published
- Publisher
- The Korean Society for Quality Management
- Journal / collection
- Journal of Korean Society for Quality Management
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.7469/jksqm.2025.53.3.329
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Cite this source
Minju Kim; Jaehyeop Hong; Youngbum Hur. Out-of-Distribution Detection for Semiconductor Wafer Map Defect Using GAN and Outlier-Exposure. Journal of Korean Society for Quality Management. 2025-09-30. https://doi.org/10.7469/jksqm.2025.53.3.329