Probing sub-nanosecond timing properties of micron-scale transition edge sensors via a parallel SQUID-semiconductor readout scheme
Yuki Mitsuya; Ryutaro Matsumoto; Mamoru Endo; Hiroyuki Takahashi
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Scientific Reports
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1038/s41598-026-70471-z
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Cite this source
Yuki Mitsuya; Ryutaro Matsumoto; Mamoru Endo; Hiroyuki Takahashi. Probing sub-nanosecond timing properties of micron-scale transition edge sensors via a parallel SQUID-semiconductor readout scheme. Scientific Reports. 2026-09-13. https://doi.org/10.1038/s41598-026-70471-z