On the Reliability of Complementary Field Effect Transistor: Unveiling the Role of Grain Granularities and Random Fluctuations
Sandeep Kumar; Deven H Patil; Sunil Rathore; Ankit Dixit; Naveen Kumar; Vihar Georgiev; S. Dasgupta; Navjeet Bagga
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Device and Materials Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tdmr.2026.3665263
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Cite this source
Sandeep Kumar; Deven H Patil; Sunil Rathore; Ankit Dixit; Naveen Kumar; Vihar Georgiev; S. Dasgupta; Navjeet Bagga. On the Reliability of Complementary Field Effect Transistor: Unveiling the Role of Grain Granularities and Random Fluctuations. IEEE Transactions on Device and Materials Reliability. 2026-03. https://doi.org/10.1109/tdmr.2026.3665263